Non-intrusive MC/DC measurement based on traces.

Year of Publication : 
Author: 
Ahishakiye, F., Jakšić, S., Stolz, V., Lange, F. D., Schmitz, M., & Thoma, D
Research Discipline: 
Publication type: 
Publisher: 
ieeexplore.ieee.org
Volume: 
NA
Issue: 
NA
Journal Name: 
. In 2019 International Symposium on Theoretical Aspects of Software Engineering (TASE)