Mc/dc test cases generation based on bdds.

Year of Publication :

Author:

Ahishakiye, F., Requeno Jarabo, J. I., Kristensen, L. M., & Stolz, V.

College:

Research Discipline:

Publication type:

Publisher:

Springer

Volume:

Issue:

Journal Name:

In International Symposium on Dependable Software Engineering: Theories, Tools, and Applications